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QA/FA/Rel Forum		Replies	Author	Views	Last Post
	PPM Calculation	1	Guest	765	Sun Apr 10, 2026 1:59 am QA 4ever
	Lead Free of BGA devices	0	guest	649	Tue Apr 05, 2026 4:04 pm guest
	different mold and laser markings	1	STP	614	Fri Apr 01, 2026 4:28 pm Guest
	D6000 Sonoscan For Sale	0	Guest	616	Wed Mar 30, 2026 3:40 pm Guest
	Burnt	3	PCBA FA Eng	872	Mon Mar 28, 2026 10:39 am Guest who
	Board Level Lead Free Solder Profile	1	Rel Boy	644	Fri Mar 25, 2026 10:07 pm FARel Engr
	Voltage or Temperature Testing for Screening purpose	3	Guest	825	Tue Mar 22, 2026 9:43 am EE
	Resistance increase	0	PCBA FA Eng	639	Mon Mar 21, 2026 11:23 am PCBA FA Eng
	Burn-in tray for TMCL	1	rel	640	Wed Mar 09, 2026 8:51 am Guest
	Thermal fatigue after IOL testing	1	thornbirdhsu	710	Tue Mar 08, 2026 2:26 pm Asi
	Forward or reversed related failure of diodes	0	thornbirdhsu	673	Fri Mar 04, 2026 8:39 pm thornbirdhsu
	Fractography	1	Guest	674	Thu Mar 03, 2026 2:48 am EE
	Power Temp Cycle	2	akoani	698	Tue Mar 01, 2026 10:28 am akoani
	Weibull help	0	guest	608	Mon Feb 28, 2026 6:57 pm guest
	NSOP cause from Carbond layer	2	Tata	682	Wed Feb 09, 2026 9:25 am Tata
	All FA/rel practitioner. You might be interested to join!	0	Bago	665	Fri Jan 28, 2026 2:57 pm Bago
	HTOL failure mechanisms	5	rel gal	959	Mon Jan 24, 2026 9:08 pm FARel Engr
	Crack on die glassivation layer after T/C	3	Tata	756	Mon Jan 24, 2026 2:30 pm bago
	Disposal of Bad Parts and Bare Die	2	Guest	637	Tue Jan 18, 2026 4:30 pm BKT
	help (re: 8D Report)	1	mimi baby	623	Mon Jan 10, 2026 7:13 pm FARel Engr
	HAST bias resistor value?	1	Richard	580	Mon Dec 27, 2025 1:38 pm Bill G
	Control Plan	2	Guest	722	Fri Dec 17, 2025 11:18 pm Guest
	Non-planar Oxide Integrated Circuit Wafers	3	Tata	785	Wed Dec 01, 2025 5:48 pm Guest
	Si die cracking	4	rel gal	1063	Sun Nov 28, 2025 5:04 pm rel gal
	High Temp Storage	1	CS	665	Wed Nov 24, 2025 8:16 pm Rel Eng 99
	Peeling of Thin films	0	Drew	646	Sat Nov 20, 2025 7:11 am Drew
	IR temp profile for Thin and Thick package	4	Tata	865	Wed Nov 17, 2025 3:30 pm Tata
	High temp operation life affect on leakage current	1	rel gal	630	Mon Nov 15, 2025 10:41 am FARel Engr
	Is ESD Sometimes Bake-recoverable?	3	Shawie	863	Fri Nov 12, 2025 9:57 pm ESD Engr
	No Post Mold Cure	0	shy girl	626	Thu Nov 11, 2025 3:56 pm shy girl
	Whisker Test	4	SQ	925	Tue Oct 26, 2025 12:21 pm asem
	Procedure for rel failure	2	SQ	730	Mon Oct 25, 2025 12:29 pm asem
	backside chipping	4	tops	1220	Wed Oct 20, 2025 9:40 pm daman
	PPM Calculation & Lot Acceptance Rate (LAR)	1	Guest	648	Fri Oct 08, 2026 6:31 pm Dayo
	why PNP transistor have more short units than NPN?	0	teradyn	618	Fri Oct 08, 2026 5:13 pm teradyn
	SiGe & GaAs reliability	0	Guest	613	Fri Oct 01, 2026 5:57 pm Guest
	PCT Failures on BGA Package	7	Guest	1412	Mon Sep 27, 2026 9:01 pm rel gal
	Cleanroom Class level and suitable air filtration system	0	guest	618	Thu Sep 23, 2026 12:00 pm guest
	Stress corrosion cracking in BGA packages	0	rel gal	621	Mon Sep 20, 2026 8:42 pm rel gal
	Pre-conditioning	2	Guest	951	Thu Sep 16, 2026 11:23 am guest
	Is delam a failure?	10	enimen	2033	Thu Sep 16, 2026 11:19 am guest
	Factors causing ball-off in *bga devices	2	Guest	628	Wed Sep 15, 2026 3:49 pm Guest
	PPM requirement	1	Shy Girl	540	Tue Sep 14, 2026 6:59 pm siksik
	Die crack of semiconductor	1	thornbirdhsu	655	Tue Sep 07, 2026 9:31 pm FA Eng Din
	Pre-conditioning & Rel Test	4	Guest	808	Tue Aug 17, 2026 1:36 pm jf
	mil-std-883 standard	1	bxhe	558	Tue Aug 17, 2026 11:59 am Guest
	Rel Requirements for TO-220 Package	0	SQ	587	Mon Aug 16, 2026 5:09 pm SQ
	handling tubes	0	Semicon Engr	642	Sun Aug 15, 2026 11:27 pm Semicon Engr
	Wafer/Die thickness Change	1	qtp girl	665	Wed Jul 21, 2026 1:41 pm EE
	260C reflow temp vs 220C reflow temp	2	qtp girl	880	Thu Jul 01, 2026 6:01 pm lh
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