Joined: 20 Jun 2026 Posts: 76
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| Posted: Wed Nov 19, 2025 11:31 am Post subject: |
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Secret,
Here are my suggestions to you: 1) full FA on the failures; 2) EOS simulations. A bit of caution: some EOS occurrences will be difficult to trace to actual cause, since they can be caused by either burn-in or e-test. Don't expect to be able to trace all of them.
FARel Engr |
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