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Chip Scale
Package (CSP) - Page 2 of 2
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A typical
chip scale packaging process
starts with the mounting of the die on the interposer using epoxy,
usually of non-conductive type (although conductive epoxy is also used
when the die backside needs to be connected to the circuit). The
die is then wirebonded to the interposer using gold or aluminum wires.
Wirebond profiles must be as low and as close to the die as possible in
order to minimize package size.
Plastic encapsulation to protect
the die and wires then follows, usually by transfer molding. After
encapsulation, solder balls are attached to the bottom side of the
interposer, after which the package is marked. Finally, the parts are
singulated from the leadframe.
Figure
3. Cross-section of a Wirebonded CSP
Figure
4. Cross-section of a Flip-chip CSP
The chip
scale package is relatively new, so industry standards for producing
CSP's have not yet been completely developed. Nonetheless, the Institute
for Interconnecting and Packaging Electronic Circuits (IPC) has already
released J-STD-012, "Implementation of Flip Chip and Chip Scale
Technology." This document discusses technology overview and
design considerations, as well as material, processing, mounting,
interconnection, reliability, and standardization aspects of CSP
manufacturing.
The industry
is moving towards the development of more chip scale packaging
standards. Some of the new standards being developed as of this
writing are, in fact, defined by J-STD-012. These standards are
shown in Table 1.
Table 1.
Flip Chip and CSP Standards Currently Undergoing Development
|
Std No.
102 |
Mechanical outline Standard for Flip Chip or Chip Scale
Configurations |
|
Std No.
103 |
Performance Standard for Flip Chip/Chip Scale Bumps |
|
Std No.
104 |
Test
Methods for Flip Chip or Chip Scale Performance |
|
Std No.
105 |
Flip
Chip/Chip Scale Carrier Tray Standard |
|
Std No.
106 |
Bare Dice
as Flip Chip or Chip Scale Configuration Management Standard |
|
Std No.
107 |
Design
Standard for Flip Chip and Chip Scale Mounting Structures |
|
Std No.
111 |
Design
Standard for Flip Chip/Chip Scale Assembly Configuration |
|
Std No.
112 |
Standard
for Flip Chip/Chip Scale Assembly Performance Requirements |
|
Std No.
113 |
Test
Methods for Qualification and Evaluation of Flip Chip/Chip Scale
Assemblies |
|
Std No.
114 |
Standard
for Flip Chip/Chip Scale Assembly Rework and Repair Techniques |
|
Std No.
115 |
Flip
Chip/Chip Scale Assembly Reliability Standard |
|
Std No.
120 |
Qualification and Performance Standard for Flux used in Flip Chip
Assembly |
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