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akotoh
Guest	Posted: Tue Apr 12, 2026 3:51 pm    Post subject: Any latest FA Techniques on RF/Mixed-Signal Products   Hi, Could someone share what are the different FA Techniques for RF/Mixed-Signals IC? Thanks
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jlo
Guest	Posted: Tue Apr 12, 2026 9:04 pm    Post subject:   I think the FA flow and techniques should be the same. It's the excitation of the device and interpretation of its responses that might be different. are you thinking of any particular fmech? jlo
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Akotoh
Guest	Posted: Wed Apr 27, 2026 10:49 am    Post subject:   How can you test/FA a functional failure in a mixed-signal/RF products? Can a scan chain method be applicable in this type of failure? For example, the failure is on the core (RF Part) of the IC, how can scan detect that kind of failure? Thanks
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