Semiconductor Test Parameters

The correct and efficient electrical testing of finished products is a critical aspect of semiconductor manufacturing. Electrical testing ensures that the customers will receive devices that operate in accordance with the devices' published electrical specifications.

The electrical testing of semiconductor products basically consists of subjecting them to a series of 'test blocks', each of which tests them for a certain electrical characteristic, or test parameter. The complete set of test blocks is often referred to as the 'test program' for that device.

Every test block therefore needs to provide the device under test (DUT) with a predetermined set of electrical stimuli that correspond to the test parameter being checked. The DUT's response to these stimuli is then compared to an expected result.

To determine whether a DUT passes a test or not, each test parameter must have preset limits against which the DUT's response is compared. Some parameters have both lower and higher specification limits, while others just have either a lower or higher specification limit.

The following links present examples of test parameters for the device types indicated:

- Test Parameters for Operational Amplifiers

- Test Parameters for A/D Converters

- Test Parameters for D/A Converters

- Test Parameters for SRAMs

- Test Parameters for EPROMs

- Test Parameters for Analog Switches

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