Die Surface Contamination - SemiconFarEast.com Gallery

SemiconFarEast.com Gallery: Die Surface Contamination

Figure 1. Die Surface Contamination

Figure 1 shows SEM photos of a microscopic heap of contaminant material on the surface of a die at low magnification (left) and high magnification (right).

EDX analysis needs to be performed on dice such as this to identify the elements present in the contamination. The presence of foreign elements such as Cl, S, and P can lead to corrosion, and must therefore be considered as a possible ground for rejecting all units that may be affected by the same contamination issue.

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