2)
Failure
Verification.
Verify the customer's failure mode by electrical testing.
3)
External Visual
Inspection.
Perform a thorough external visual inspection on the sample. Note
all package anomalies that may indicate the unit having been subjected to
thermo-mechanical stresses, i.e., package cracks/chip-outs, tool marks,
bent leads, discolored/burned package, etc.
4)
Bench Testing.
Verify the electrical test results by bench testing.
5)
Curve Tracing.
Perform curve tracing at ambient, elevated (125C-150C) and low
temperature (-10C to -40C). Look for open or shorted pins which may
indicate gross die cracking. Note, however, that some die crack
failures may only exhibit subtle I/V curve anomalies.
7)
X-ray
Inspection.
Perform x-ray inspection on the sample. Check for die attach
problems such as excessive voids, die overhang, insufficient die attach
coverage, and insufficient fillet. Check also for molding compound voids
and cracks. Gross die cracks may also be found using sophisticated x-ray
equipment.
8)
CSAM.
Perform CSAM on plastic packages to determine if the samples have any
internal delaminations that are indicative of the unit having been
subjected to extremely high temperatures. Units with severe die attach
abnormalities will exhibit die cracking upon exposure to temperature
extremes.
9)
Decapsulation/Internal Visual Inspection.
Perform internal visual inspection after decap to confirm the die crack.
The crack pattern on the die surface as well as the die edge must be fully
understood through extensive optical and SEM inspection.
10)
Full
Decapsulation.
Many die cracking issues involve die cracks that originate from the
backside of the die. If SEM inspection of the die surface and die
edge indicates that the cracks most likely originated from the die
backside, then full decapsulation must be done. Full decapsulation
consists of immersing the entire unit in acid to disintegrate the entire
package, leaving behind the die only. The die backside crack pattern
may then be inspected freely once full decap is completed.
11)
Fractography.
Fractography is the systematic and scientific process of determining the
origination and propagation of the cracking mechanism by studying the
attributes of the fracture surface of the die. Fractography is a
complicated process and can only be done reliably through years of study
and experience. Once mastered, fractography would be an indispensable tool
for analyzing die crack issues.
Note
that Steps 9, 10, and 11 all have one objective: to understand the crack
origin and propagation pattern to determine what stresses were applied to
the die.
12)
Conclusion.
As
may be discerned from above, the basic flow of a die cracking FA consists
of the following: a) taking note of all electrical and visual/mechanical
attributes of the sample before decap; b) confirmation of the die crack
after decap; c) determination of the point of origin and propagation
pattern of the die crack; d) determination of the points of application
and direction of the
stresses most likely
experienced by the die based on the crack origin and propagation; and e)
subsequent investigations, simulations, or evaluations to identify the
root cause of the stresses.
<Back to Page 1 - Introduction and Die-Level FA Flow>
<Back to Page 2 - Ball Lifting FA Flow>
<Proceed to Page 4 - Package Cracking FA Flow>
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