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There are
many ways of describing or classifying a CVD reactor. For
instance, a reactor is said to be
'hot-wall'
if it
uses a heating system that heats up not only the wafer, but the walls of
the reactor itself, an example of which is radiant heating from
resistance-heated coils. 'Cold-wall'
reactors use heating systems that minimize the heating up of the reactor
walls while the wafer is being heated up, an example of which is heating
via IR lamps inside the reactor. In hot-wall reactors, films are
deposited on the walls in much the same way as they are deposited on
wafers, so this type of reactor requires frequent wall cleaning.
Another way
of classifying CVD reactors is by basing it on the range of their
operating pressure.
Atmospheric
pressure CVD
(APCVD)
reactors operate at atmospheric pressure, and are therefore the simplest
in design.
Low-pressure
CVD (LPCVD)
reactors operate at medium vacuum (30-250 Pa) and higher temperature
than APCVD reactors.
Plasma
Enhanced CVD
(PECVD) reactors also operate under low pressure, but do not depend
completely on thermal energy to accelerate the reaction processes. They
also transfer energy to the reactant gases by using an RF-induced glow
discharge.
The glow
discharge used by a PECVD reactor is created by applying an RF field to
a low-pressure gas, creating free electrons within the discharge region.
The electrons are sufficiently energized by the electric field that
gas-phase dissociation and ionization of the reactant gases occur when
the free electrons collide with them. Energetic species are then
adsorbed on the film surface, where they are subjected to ion and
electron bombardment, rearrangements, reactions with other species, new
bond formation, and film formation and growth.
Table 1
compares the characteristics of typical APCVD, LPCVD, and PECVD
reactors.
Table 1.
APCVD, LPCVD, and PECVD Comparisons
|
CVD Process |
Advantages |
Disadvantages |
Applications |
|
APCVD |
Simple,
Fast
Deposition,
Low
Temperature |
Poor Step
Coverage,
Contamination |
Low-temperature Oxides |
|
LPCVD |
Excellent
Purity,
Excellent
Uniformity,
Good Step
Coverage,
Large
Wafer Capacity |
High
Temperature,
Slow
Deposition |
High-temperature Oxides, Silicon Nitride, Poly-Si, W, WSi2 |
|
PECVD |
Low
Temperature,
Good Step
Coverage |
Chemical
and Particle Contamination |
Low-temperature Insulators over Metals, Nitride Passivation |
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