![]() |
|||||||||
|
Ball Bond Lifting | |||||||||
|
See Also:
|
Ball bond lifting, or simply ball lifting, is the
detachment of a ball bond from the bond pad. It can be due to a variety
of factors. Poor wirebonder
set-up and bond pad surface contamination are primary causes of ball
lifting. Poor set-up includes
improper parameter settings, unstable workpiece holders, and worn-out
tools. These result in poor
initial welding and inadequate intermetallic formation between the bond pad and
the ball. Ball lifting can also be
due to contaminants on the bond pad, which act as barriers between the
ball and the bond pad. Common
contaminants that inhibit good bonding include unetched glass, unremoved
photoresist, and Si saw dust.
Resin bleed-out from the die attach material can also impede good
bonding and result in ball lifting. Halides such as Cl on the bond pad can
trigger corrosion, which is again another source of ball lifting. Silicon
nodules on the surface of bond pads with no barrier metallization
underneath can also result in poor ball bonding.
Lifted balls may also result from excessive interdiffusion between the bond pad and ball bond metals. Kirkendall voiding, which is the formation of voids underneath the ball bond due to excessive diffusion of Al from the bond pad to the Au ball bond to form purple plague, is an example of this mechanism. The reflow of thermoplastic die attach material at the bonding temperature also results in ball lifting, because it allows movement of the die during the thermosonic bonding itself.
Cratering, which is considered to be a different failure mechanism, can also manifest as a lifted ball, with the Si underneath the bond pad coming off with the bond. Similarly, bond pad peel-off from the barrier metal can result in ball lifting. Studies have likewise shown that excessive probing damage or deep probe marks on the bond pad can lead to ball lifting.
Copyright © 2001-2004 www.SemiconFarEast.com. All Rights Reserved. |