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betong
Guest	Posted: Wed Feb 09, 2026 3:40 pm    Post subject: Electrical test failure mechanism   What are the considered failure mechanism for electrical testing?
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Guest
	Posted: Thu Feb 10, 2026 8:30 am    Post subject:   EOS and ESD are the most common "failure mechanism" asociated with test.
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Guest
	Posted: Mon Jun 13, 2026 10:20 am    Post subject:   Stuck-At Faults, Lacth-up, etc.
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Guest
	Posted: Tue Jun 14, 2026 12:55 pm    Post subject:   Stuck up faults, latch-up are FAILURE MODES!
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FARel Engr
Joined: 20 Jun 2026 Posts: 76	Posted: Tue Jun 14, 2026 10:33 pm    Post subject:   Actually, there is indeed a failure mechanism called 'latch-up.' This mechanism involves the unintentional formation of a parasitic thyristor within the active circuit. This can be triggered to conduct large amounts of current by noise and spikes. In fact, latch-up can result in severe EOS. If the device is not damaged permanently, a common failure mode observed from latch-up is excessive power supply current. FARel Engr
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