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 Posted: Sun Nov 14, 2025 9:37 pm Post subject: High temp operation life affect on leakage current |
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| What kind of effect HTOL test would have on insulation related problems that result in leakage current? Is this failure mechanism stimulated under HTOL or will it be subdued under high temp? |
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Joined: 20 Jun 2026
Posts: 43
| Posted: Mon Nov 15, 2025 10:41 am Post subject: |
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| Hi Rel Gal,
I'm assuming that when you say 'insulation', you're referring to interlayer dielectrics. Yes, HTOL can result in degradation of these dielectric layers. Normally, however, once a critical point is reached, the degradation very quickly turns into dielectric rupture, which may lead to a functional failure, not just leakage. Other leakage-related mechanisms that are accelerated by burn-in aside from dielectric degradation are: mobile ionic contamination (which should be recoverable by bake), and surface charging. On the other hand, a leakage problem that is 'subdued' by burn-in but accelerated by LTOL may be due to hot carrier effects. Please complete the full FA first and let us know your findings. FARel Engr |
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