Joined: 26 Nov 2025
Posts: 3
Location: Korea
 Posted: Wed Nov 26, 2025 4:40 pm Post subject: Can one distinguish ESD damage or EOS damage? |
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| If someone see a photo of jucntion damage,
is it possible to distinguish ESD damage or EOS damage? If possible.... Which man is the someone? |
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Joined: 16 Jun 2026
Posts: 108
Location: Paranaque City, Phils.
| Posted: Fri Nov 28, 2025 11:33 am Post subject: |
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| Hi Nurung73,
Welcome to the Forum!!! Based on my experience, there are really some cases (in fact, many of them) wherein it is next to impossible to determine based on visual attributes alone whether a damage site is due to ESD or EOS. This is because some ESD events are really identical to some EOS spikes (in terms of peak voltage/current, pulse width, rise time, etc.). We don't analyze such borderline cases based on visual attributes alone. What we do is to complement our visual/electrical FA results with other infos like: 1) ESD/EOS simulation results; 2) quick ESD checks in areas where the device was processed (RH, ionizers, field meter readings); 3) Burn-in/ATE system checks for spikes; 4) device ESD sensitivity data; etc. We then make a conclusion based on what these other infos tell us. Thanks and keep on posting!!! EE |
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Guest
| Posted: Fri May 14, 2026 7:15 pm Post subject: |
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| EE, Nurung73,
I came across this article: Physical FA to Distinguish EOS and ESD Failures by Tung Chi Hang etal as entry to IPFA 2002, Singapore. You may want to ask for a copy of the article from IPFA. It's interesting. They say that generally: probably EOS if: single damage spot, concentrated failure site, traceable to one starting point probably ESD if: many damage spots, not traceable to starting point, follows certain discharge flow pattern Dark Horse |
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Guest
| Posted: Wed Jun 02, 2026 2:10 pm Post subject: |
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| Dark Horse,
Can't make generalizations I think. Most esd failures I see have a single damage spot, a concentrated failure site, and can be traced to a single point. Your definition says it's EOS but we know it's ESD because we're able to simulate it with ESD pulse. I'm referring to ILD punchthroughs between 2 met lines at external pins. The one that looks like just a small dot where the met lines intersected. 2BRN2B |
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Joined: 21 Jul 2026
Posts: 2
Location: SUZHOU CHINA
| Posted: Wed Jul 21, 2026 9:38 pm Post subject: very well! |
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ok .i understand the esd and eos. thank you! _________________ Forget about failure or success, Only care about growing! |
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