Contam on Bond Pad

 
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Seinfeld
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PostPosted: Wed Jul 30, 2026 1:24 pm    Post subject: Contam on Bond Pad Reply with quote

We're experiencing ball lift issues and we think the bond pads of our lots are contaminated. But visual inspection using the microscope showed that the pads are clean. Is it still possible that the pads are contaminated? What tests do you recommend for us to check this?

Seinfeld


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Memsy



Joined: 23 Jun 2026
Posts: 3

PostPosted: Wed Jul 30, 2026 6:46 pm    Post subject: Reply with quote

Try EDX analysis.



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EE



Joined: 16 Jun 2026
Posts: 108
Location: Paranaque City, Phils.

PostPosted: Thu Jul 31, 2026 10:08 am    Post subject: Reply with quote

Hi Seinfeld,

At the correct EHT level during EDX analysis, the EDX spectrum will only register Al if the bond pad is clean. Given that your bond pads do not exhibit any visual anomalies, the contam may be in the form of a very thin layer of unetched glass. This would register as a peak of Si in the EDX spectrum.

Note, however, that Si may also register in the spectrum of a clean bond pad if the EHT used is too high. This is because the silicon under the aluminum bond pad is now being detected by EDX. Thus, if you see both Al and Si in your first spectrum, you must get another spectrum to verify if the SI is above or below the aluminum layer.

If it’s really unetched glass that’s on your bond pad, you will see Si and Al at a very low EHT, then see Al rising relative to Si as you increase the EHT, then eventually reach a point where the Si peak increases more quickly relative to the Al peak as the EHT is increased.

Needless to say, if you see S, P, K, or Cl on your bond pads, you don’t need to get EDX spectra at different EHT’s since you’re sure that these couldn’t have come from below the bond pad.

Thanks and keep on posting!

EE


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Seinfeld
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PostPosted: Fri Aug 01, 2026 10:35 am    Post subject: Reply with quote

We tried EDX at low EHT (5 keV) and saw significant silicon peak and just a small aluminum peak. We can already conclude that there's silicon contam on top of the bond pad, right?

Seinfeld


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FARel Engr



Joined: 20 Jun 2026
Posts: 43

PostPosted: Fri Aug 01, 2026 11:03 am    Post subject: Reply with quote

Yes, I think you can make that conclusion because a bond pad should only show Al and O at that EHT. Just a warning - using a low EHT for EDX analysis will not generate peaks of some elements, so you might not see all the elements present if the EHT is low. This is why EE is suggesting other EHT levels too.

Regards,
FARel Engr


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